"Devils Tower": Transmission Electron Microscopy

 

In material science and life science research, the transmission electron microscope (TEM) is an indispensable analytical instrument. Operating within the nanoscale dimension, TEM functions as a foundational technology, yielding vital insights into intricate structural and chemical configurations. At CASI, our laboratory is outfitted with the Thermo Scientific Talos F200X Scanning Transmission Electron Microscope. This cutting-edge apparatus combines electron diffraction, high-resolution TEM (HR-TEM) imaging, and high-resolution scanning transmission microscopy (STEM) imaging, along with the industry-leading Super-X energy-dispersive X-ray spectroscopy (EDS) system. Capable of examining samples' structural, morphological, and chemical details from the sub-micrometer to sub-nanometer scale, executing analyses with both rapidity and precision. Moreover, it possesses the capability for comprehensive 2D and 3D topographical evaluations. This instrument was funded by the Wyoming Innovation Partnership. 

 

 

Instrument Highlights

• X-FEG High Brightness Electron Source:

The pinnacle performance of TEM and STEM systems relies significantly on electron source properties. High brightness, temporal coherence, and spatial coherence are essential for achieving ultra-high-resolution results. High brightness is imperative for atomic resolution imaging and analytical precision in HR-STEM and HR-TEM. The X-FEG outshines the standard Schottky-FEG by delivering remarkably heightened brightness to optimize both TEM and STEM performance.

• High-Resolution TEM and STEM Imaging:

The X-FEG empowers enhanced imaging precision. The microscope offers high-resolution transmission electron microscopy (HRTEM) with an optimal resolution of 0.12nm. It also provides high resolution for scanning transmission electron microscopy (STEM) imaging, boasting an optimal resolution of 0.16nm.

• Fast and Accurate EDS Mapping:

The Talos F200X G2 (S)TEM integrates the industry-leading Thermo Scientific Super-X™ EDS system. Four individual silicon drift detectors (SDDs) operate independently, offering exceptional sensitivity and mapping capabilities of up to 105 spectra per second. Integration with the X-TWIN objective lens maximizes collection efficiency and output count rates, even for low-intensity EDS signals.

• Tilting Series with Analytic Topography:

This TEM has the tilting series featuring TEM/STEM/EDS capabilities and 3D reconstruction. Equipped with an analytic topography sample holder, it facilitates 3D chemical characterization through compositional mapping.

• Streamlined Operation with Align Genie:

Experience operational ease with the Align Genie Automation Software, catering to novice users and simplifying multi-user environments. It expedites data acquisition for seasoned practitioners, fostering unencumbered exploration.

• Reduced Environmental Impact:

The microscope's instrument enclosure mitigates environmental factors like air pressure waves, air flows, and temperature fluctuations in the TEM room. This reduction in sensitivity enhances imaging and analysis stability, ensuring consistent and reliable results.

Specifications

Feature	Specification
Accelerating Voltage	80kV or 200kV
Electron Source	X-FEG high brightness electron source
Vacuum	<1.2 × 10-5 Pa (oil-free)
TEM detector	4k × 4k Ceta 16M camera (large size view)
HR-TEM Resolution	point resolution 0.25 nm, line resolution 0.12 nm
STEM resolution	0.16 nm
STEM detector	HAADF
Super-X EDS system	4 SDD symmetric design, windowless, shutter-protected (fast and accurate elemental mapping)
EDX solid angle	0.9 srad
EDX detecting range	down to and including boron
Maximum diffraction angle	24°
sample holders	CompuStage single-tilt (x = ±35°) holder
	High-visibility low-background double-tilt (x = ±35°, y = ±30°) holder for optimized EDS acquisition
	Fischione Tomography holder Model 2020 with high-tilt angles (x = ±70°)
Software	TEM scripting for controlling the microscopy by a user application
	TIA for CTEM and HRTEM
	Velox software for STEM/DPC imaging and EDS acquisition
	Automatic acquisition of tilting series for tomography with EDS capability
	Align Genie for automated alignment software for the correction of focus and astigmatism correction
	AVIZO is used for imaging processing and analysis (both 2D and 3D)
Location	Science Initiative Building 1311
Fee	Listed in Rates

 

Contact Info & Location

 

Instrument Manager: Qian Yang, qyang3@uwyo.edu 

Instrument Location: Science Initiative Building 1311