This is a ZEISS Xradia Versa 610 high-resolution 3D X-ray microscope (XRM), also known as a micro-CT (Computed Tomography), designed to push the boundaries of non-destructive imaging. This state-of-the-art instrument empowers researchers from various disciplines to gain new insights into the microstructure of materials with unprecedented versatility.
The ZEISS Xradia Versa 610 leverages a two-stage magnification architecture and a 25 W X-ray sealed source, providing higher X-ray flux and exceptional image resolution. With a true spatial resolution of 500 nm and a minimum achievable voxel size of 40 nm, researchers can explore the finest details of their samples without compromising clarity. The system offers excellent resolution over various sample types, proportions, and operational ranges, making it ideal for diverse scientific investigations in life science, material science, geology, and engineering. This instrument was funded by the Wyoming Innovation Partnership.
The ZEISS Xradia Versa 610 uses a two-stage magnification architecture and a 25 W X-ray sealed source, providing high X-ray flux for quicker sub-micron scale resolution images without compromising clarity. With a true spatial resolution of 500 nm and a minimum achievable voxel size of 40 nm, researchers can explore the finest details of their samples. The system maintains exceptional resolution over various sample types, proportions, and operational ranges, making it ideal for diverse scientific investigations.
The Xradia Versa 610 offers premier in situ and 4D imaging capabilities, enabling non-destructive characterization of the microstructure of materials under controlled variations (in situ) and observing the evolution of structures over time (4D). It accommodates various sample sizes, environmental chambers, and high precision in situ load rigs without sacrificing resolution. The instrument seamlessly integrates with other ZEISS microscopes for multi-scale correlative imaging solutions.
Researchers can gain new degrees of freedom in their scientific and industrial research by characterizing and quantifying samples under varying conditions and native-like environments. The Xradia Versa 610 supports advanced material and property characterization with increased absorption and phase contrast. Advanced acquisition techniques enable faster and more precise scanning of large or irregular samples. Additionally, Dragonfly Pro software allows for efficient sample segmentation and post-processing, while machine learning methods can be employed to assist with sample analysis and segmentation.
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Specification |
Details |
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Spatial Resolution |
True spatial resolution of 500 nm |
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Voxel Size |
Minimum achievable voxel size of 40 nm |
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Source Technology |
25 W X-ray sealed source |
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Detector |
CCD |
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Source Voltage Range |
30-160 kV |
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Max Power |
25 W |
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Objectives |
0.4X, 4X, 20X |
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Max Sample Size |
Up to 25 kg and 300 mm in diameter |
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Imaging Capability |
Non-destructive 3D X-ray microscopy (micro-CT) |
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In Situ Imaging |
Deben stage is available for characterizing samples under controlled variations |
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Software |
Dragonfly Pro software for sample segmentation and post-processing |
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Machine Learning |
Utilizes machine learning methods for sample analysis and segmentation |
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Location |
Science Initiative Building 1305, Bay 4 |
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Fee |
Listed in Rates |
Instrument Manager: Qian Yang, qyang3@uwyo.edu
Instrument Location: Science Initiative Building 1305